ICSM’2012 - 3rd International Conference on Surface Metrology (3/21/2012 - 3/23/2012)

In many domains the metrology of surfaces brings concrete answers to very diverse requirements. These measures are made possible thanks to devices in constant evolution, which benefit from the latest scientific advances. Hardware and software are progressing hand in hand. It will be interesting to measure this progress through the workshops, the applied  sessions and the exhibition.
"Making complexity understandable" could be a subtitle for this conference. Since the more we try to learn about a given surface to better understand its function, the more the measured data can become rich and complex to analyze. Our common stake is to get down towards this complexity in order to abstract/infer a simple analysis, on which a decision can be based. That challenge will be a central topic of the conference.
Submissions are invited from all fields involving the measurement and analysis of surface metrologies including: archeology, art conservation, anthropology, biology, biomedical engineering, chemistry, civil engineering, counterfeiting, defense, forensic, food science, geodetics, geology, material science, mechanical engineering, medical sciences, physics, security, sport equipment,
tribology, etc.

Deadline for abstracts/proposals: December 15, 2011

Futher information
Scope, Topics, Information for authors, Registration, etc. see the event website.
Contact: Prof. Serge SAMPER Polytech Annecy Chambery Annecy, France Fax:    +33-(0)4 50 09 65 43
Please, email the abstracts to: icsm2012@univ-savoie.fr